This course will address light, electron, atomic force, and confocal microscopy as complimentary study methods. The history of microscopy will allow comparison and contrasts of light and electron optics. The focus of the course will be on advanced imaging techniques, especially electron microscopy. Electron paths will be followed from filament generation of primary electrons, focusing electrons through the column, to specimen interactions generating secondary and backscattered electrons, and X-rays. Techniques will include sample fixation, dehydration, mounting, coating and storage for high and low vacuum systems. A discussion of X-ray microanalysis will show the quantitative side of advanced imaging. Students will gain hands-on experience with scanning electron microscopy. This course has complimentary lecture and lab assignments. Pre-Requisities: Admission to the Master of Science program.
LSCI-506: Microscopic Imaging Theory and Technique
Class Program